Picosecond X-ray Diffraction Studies of Shocked Crystals

J.S. Wark; A. Allen; J. Belak; T. Boehly; A. Hauer; B. Holian; D. Kalantar; G. Kyrala; R.W. Lee; P. Lomdahl; A. Loveridge-Smith; M.A. Meyers; D. Paisley; S. Pollaine; B. Remington; D.C. Swift; S. Weber

doi:10.1364/HFSW.2001.WC1

Applications of High Field and Short Wavelength Sources IX
OSA Trends in Optics and Photonics (Optica Publishing Group, 2001),
paper WC1
•https://doi.org/10.1364/HFSW.2001.WC1

Picosecond X-ray Diffraction Studies of Shocked Crystals

J.S. Wark, A. Allen, J. Belak, T. Boehly, A. Hauer, B. Holian, D. Kalantar, G. Kyrala, R.W. Lee, P. Lomdahl, A. Loveridge-Smith, M.A. Meyers, D. Paisley, S. Pollaine, B. Remington, D.C. Swift, and S. Weber

Applications of High Field and Short Wavelength Sources 2001

Palm Springs, California United States
ISBN: 1-55752-687-7

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X-ray Probing of Plasma & Shock Waves (WC)

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J. S. Wark, A. Allen, J. Belak, T. Boehly, A. Hauer, B. Holian, D. Kalantar, G. Kyrala, R. W. Lee, P. Lomdahl, A. Loveridge-Smith, M. A. Meyers, D. Paisley, S. Pollaine, B. Remington, D. C. Swift, and S. Weber, "Picosecond X-ray Diffraction Studies of Shocked Crystals," in Applications of High Field and Short Wavelength Sources IX, A. Sawchuk, ed., Vol. 65 of OSA Trends in Optics and Photonics (Optica Publishing Group, 2001), paper WC1.

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Abstract

We have used picosecond X-ray diffraction to gain information on the timescale of plastic flow in shock compressed single crystals of silicon (Si) and copper (Cu).

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