Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

On-chip Nano-localization via Transverse Kerker Scattering

Not Accessible

Your library or personal account may give you access

Abstract

Here we present a transverse Kerker scattering based sub-wavelength localization technique transferred to a chip-scale all-optical displacement sensing device, which could act as a metrological instrument in modern lithography and microscopy, or monitor system drifts.

© 2020 The Author(s)

PDF Article  |   Presentation Video
More Like This
On-Chip All-Optical Polarisation Pulling via Stimulated Brillouin Scattering

Nicholas J. Athanasios, Kunlun Yan, Khu Vu, Duk-Yong Choi, Pan Ma, Stephen J. Madden, Benjamin J. Eggleton, and Moritz Merklein.
C9G_2 Conference on Lasers and Electro-Optics/Pacific Rim (CLEO/PR) 2020

Transfer Matrix Method for Kerker-type Scattering of Metasurface

Xia Zhang, Jing Li, John F. Donegan, and A. Louise Bradley
JW1A.5 CLEO: Applications and Technology (CLEO:A&T) 2021

Huygens Dipole for Nanolocalization

Ankan Bag, Martin Neugebauer, Paweł Woźniak, Gerd Leuchs, and Peter Banzer
FM3C.6 Frontiers in Optics (FiO) 2018

Presentation Video

Presentation video access is available to:

  1. Optica Publishing Group subscribers
  2. Technical meeting attendees
  3. Optica members who wish to use one of their free downloads. Please download the article first. After downloading, please refresh this page.

Contact your librarian or system administrator
or
Log in to access Optica Member Subscription or free downloads


More Like This
On-Chip All-Optical Polarisation Pulling via Stimulated Brillouin Scattering

Nicholas J. Athanasios, Kunlun Yan, Khu Vu, Duk-Yong Choi, Pan Ma, Stephen J. Madden, Benjamin J. Eggleton, and Moritz Merklein.
C9G_2 Conference on Lasers and Electro-Optics/Pacific Rim (CLEO/PR) 2020

Transfer Matrix Method for Kerker-type Scattering of Metasurface

Xia Zhang, Jing Li, John F. Donegan, and A. Louise Bradley
JW1A.5 CLEO: Applications and Technology (CLEO:A&T) 2021

Huygens Dipole for Nanolocalization

Ankan Bag, Martin Neugebauer, Paweł Woźniak, Gerd Leuchs, and Peter Banzer
FM3C.6 Frontiers in Optics (FiO) 2018

In-situ loss measurements of silicon nano-waveguides using spectrum analysis and silver nano-wire as an obstacle in a reflection-based scattering NSOM

Yi-Zhi Sun, Xiao-Hong Yan, Hong Wei, Sylvain Blaize, Renaud Bachelot, and Wei Ding
JW2B.30 CLEO: Applications and Technology (CLEO:A&T) 2020

High-Speed Detection of Directional Scattering for Nanolocalization

Paul Beck, Martin Neugebauer, and Peter Banzer
JTu1A.8 Frontiers in Optics (FiO) 2020

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved