Abstract
This paper describes an innovative instrument that allows to measure the optical features of a thin-film filter (transmission, reflection, blocking, steepness, scattering) with 12 decades detection range and sub-nanometer spectral resolution.
© 2016 Optical Society of America
PDF ArticleMore Like This
Michel Lequime
ThC.1 Optical Interference Coatings (OIC) 2016
Marin Fouchier, Myriam Zerrad, Michel Lequime, and Claude Amra
FTh2A.5 Frontiers in Optics (FiO) 2020
Hoover Rueda, Henry Arguello, and Gonzalo R. Arce
CW5D.3 Computational Optical Sensing and Imaging (COSI) 2016