Controlling Dipole Orientation Near A Dielectric Interface Via a Buffer Layer

Xuan Long Ho; Po-Jui Chen; Wei Yen Woon; Jonathon David White

doi:10.1364/FIO.2016.FTu3F.8

Frontiers in Optics 2016
OSA Technical Digest (online) (Optica Publishing Group, 2016),
paper FTu3F.8
•https://doi.org/10.1364/FIO.2016.FTu3F.8

Controlling Dipole Orientation Near A Dielectric Interface Via a Buffer Layer

Xuan Long Ho, Po-Jui Chen, Wei Yen Woon, and Jonathon David White

Frontiers in Optics 2016

Rochester, New York United States
17–21 October 2016
ISBN: 978-1-943580-19-4

From the session
Optical Properties of Materials (FTu3F)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
X. L. Ho, P. Chen, W. Y. Woon, and J. D. White, "Controlling Dipole Orientation Near A Dielectric Interface Via a Buffer Layer," in Frontiers in Optics 2016, OSA Technical Digest (online) (Optica Publishing Group, 2016), paper FTu3F.8.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article

Abstract

Fluorescence lifetime of Rhodamine 6G on an air-dielectric interface increased by a factor of three as thickness of a PMMA layer increased suggesting a change in dipole orientation from isotropic to perpendicular.

PDF Article

More Like This

Fluorescence Enhancement by Silver Nanoparticles Controlled via Self Assembly Effect

Xiu Li, Yanfang Xu, and Luhai Li
OF4C.4 Optoelectronic Devices and Integration (OEDI) 2014

Fluctuating Emission Dipole Moments of Aligned Phosphors in Organic Light-Emitting Diodes

Rossa Mac Ciarnain, Dirk Michaelis, Thomas Wehlus, Andreas F. Rausch, Sebastian Wehrmeister, Tobias D. Schmidt, Wolfgang Brütting, Norbert Danz, Andreas Bräuer, and Andreas Tünnermann
SSW5B.3 Solid-State Lighting (SOLED) 2016

Measurement of Radiation Patterns of Electric Dipoles Close to a Plane Dielectric Interface

L. Luan, P. Sievert, and J. B. Ketterson
FThH2 Frontiers in Optics (FiO) 2005

Previous Article Next Article