Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Ultrafast Terahertz Scanning Tunneling Microscopy with Atomic Resolution

Not Accessible

Your library or personal account may give you access

Abstract

We demonstrate that ultrafast terahertz scanning tunneling microscopy (THz-STM) can probe single atoms on a silicon surface with simultaneous sub-nanometer and sub-picosecond spatio-temporal resolution. THz-STM is established as a new technique for exploring high-field non-equilibrium tunneling phenomena with single atom precision.

© 2016 Optical Society of America

PDF Article
More Like This
Sampling the Terahertz Near-Field in Ultrafast Terahertz Scanning Tunneling Microscopy

Vedran Jelic, Peter H. Nguyen, Yang Luo, Daniel Mildenberger, Jesus A. M. Calzada, Tianwu Wang, and Frank A. Hegmann
JM2A.2 CLEO: Applications and Technology (CLEO:A&T) 2018

Terahertz STM for Imaging Ultrafast Nanoscale Dynamics

Tyler L. Cocker, Vedran Jelic, James R. Hoffman, Manisha Gupta, Reginald Miller, Sean J. Molesky, Jacob A. J. Burgess, Glenda De Los Reyes, Lyubov V. Titova, Ying Y. Tsui, Mark R. Freeman, and Frank A. Hegmann
08.Tue.B.6 International Conference on Ultrafast Phenomena (UP) 2014

Improved temporal and spatial resolution in junction-mixing ultrafast scanning tunneling microscopy

Dzmitry Yarotski and Antoinette J. Taylor
MB3 Nonlinear Optics: Materials, Fundamentals and Applications (NLO) 2002

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved