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Conferences > FiO > 2016 > FF1D > FF1D.5

Demonstration of a Bit-Flip Correction for Enhanced Sensitivity Measurements

L. Cohen, Y. Pilnyak, D. Istrati, A. Retzker, and H. S. Eisenberg

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Abstract

Error correction can be used to recover the sensitivity in a noisy environment. We implement such correction after a bit-flip error. Our results show 87% recovery of the sensitivity, independent of the noise rate.

© 2016 Optical Society of America

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