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Conferences > FiO > 2015 > JW2A > JW2A.30

Measuring M2 values for On-Wafer Vertical Cavity Surface Emitting Lasers

William North, David Chacko, Peter Zeidler, Janice Blane, Kirk Ingold, Brian Souhan, and James J. Raftery

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Abstract

We report on M2 measurements taken for on-wafer vertical cavity surface emitting lasers (VCSELs). We measured M2 for oxide-confined VCSELs and photonic crystal (PhC) VCSELs of similar lasing aperture sizes.

© 2015 Optical Society of America

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