Abstract
The image quality of the two-photon microscopy is influenced by wave-front aberrations induced by the sample. Adaptive optics is often used to correct the aberrations. However, the wave-front sensing equipment is not able to distinguish signals from different specimen layers. We aim to prove that the coherence-gated wave-front sensing can be implemented to eliminate the stray reflection signal from the other specimen layers. We demonstrate here the image degradation given by the backscattered light.
© 2015 Optical Society of America
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