Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > FiO > 2015 > JTu4A > JTu4A.47

Snapshot spectro-ellipsometry based on interferometric polarization modulation

Daesuk Kim, Vamara Dembele, Yonghee Yoon, Yoonho Seo, Hyunsuk Kim, Jaejong Lee, and Robert Magnusson

Not Accessible

Your library or personal account may give you access

Abstract

This paper describes a snapshot spectro-ellipsometry based on interferometric polarization modulation. The proposed method enables us to obtain an accurate spectral Stokes vector of a thin film object in msec.

© 2015 Optical Society of America

PDF Article
More Like This
Snapshot spectroscopic polarimeter based on polarized dual spectra

D. Kim, Y. Yoon, Y. Seo, H. Kim, and R. Magnusson
26F1_4 Conference on Lasers and Electro-Optics/Pacific Rim (CLEO/PR) 2015

Snapshot full Stokes vector measurement based on spectral interferometry

Daesuk Kim, Yoonho Seo, Yonghee Yoon, and Jaejong Lee
FW5A.5 Frontiers in Optics (FiO) 2014

Dynamic spectro-ellipsometry based on a spectral interferometric phase extraction method

Vamara Dembele, Ramachandran Kasu, Inho Choi, Jayakumar Paul Madhan, Junho Kim, and Daesuk Kim
M4A.5 Digital Holography and Three-Dimensional Imaging (DH) 2017

View More...
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use