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Conferences > FiO > 2015 > FTh1B > FTh1B.2

Integrated Nanoantenna Labels for Rapid Security Testing of Semiconductor Circuits

Ronen Adato, Aydan Uyar, Mahmoud Zangeneh, Boyou Zhou, Ajay Joshi, Bennett B. Goldberg, and M. Selim Ünlü

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Abstract

We demonstrate a multi-spectral imaging technique that utilizes integrated nanoantenna labels to enable rapid mapping of the type and location of every logical gate in an integrated circuit, and thereby detect hardware tampering.

© 2015 Optical Society of America

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