THz Polarization-Dependent Imaging of Nuclear Graphite

Jing Zhang; Albert Redo-Sanchez; Xi-Cheng Zhang; Xi-Cheng Zhang

doi:10.1364/FIO.2012.FTu3A.8

Frontiers in Optics 2012/Laser Science XXVIII
OSA Technical Digest (online) (Optica Publishing Group, 2012),
paper FTu3A.8
•https://doi.org/10.1364/FIO.2012.FTu3A.8

THz Polarization-Dependent Imaging of Nuclear Graphite

Jing Zhang, Albert Redo-Sanchez, and Xi-Cheng Zhang

Frontiers in Optics 2012

Rochester, New York United States
14–18 October 2012
ISBN: 978-1-55752-956-5

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Poster Session I (FTu3A)

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J. Zhang, A. Redo-Sanchez, and X. Zhang, "THz Polarization-Dependent Imaging of Nuclear Graphite," in Frontiers in Optics 2012/Laser Science XXVIII, OSA Technical Digest (online) (Optica Publishing Group, 2012), paper FTu3A.8.

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Abstract

By imaging nuclear graphite samples in reflection at different incident polarization angles using terahertz (THz) time-domain-spectroscopy, we find that different domain distributions and levels of porosity will introduce polarization dependence in THz reflectivity.

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