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Conferences > FiO > 2011 > FTuZ > FTuZ2

Coherence retrieval by measuring the diffracted field from a binary planar phase mask

Seongkeun Cho and Miguel A. Alonso

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Abstract

A simple scheme is proposed for the retrieval of the coherence properties of a field, based on far-field measurements of the intensity following diffraction by a movable planar phase mask.

© 2011 Optical Society of America

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