Experimental Verification of the Concept of Optical Lumped Circuit Elements at IR wavelengths

Yong Sun; Brian Edwards; Andrea Alù; Andrea Alù; Nader Engheta

doi:10.1364/FIO.2010.FWO5

Frontiers in Optics 2010/Laser Science XXVI
OSA Technical Digest (CD) (Optica Publishing Group, 2010),
paper FWO5
•https://doi.org/10.1364/FIO.2010.FWO5

Experimental Verification of the Concept of Optical Lumped Circuit Elements at IR wavelengths

Yong Sun, Brian Edwards, Andrea Alù, and Nader Engheta

Frontiers in Optics 2010

Rochester, New York United States
24–28 October 2010
ISBN:

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Plasmonics and Metamaterials for Information Processing I (FWO)

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Y. Sun, B. Edwards, A. Alù, and N. Engheta, "Experimental Verification of the Concept of Optical Lumped Circuit Elements at IR wavelengths," in Frontiers in Optics 2010/Laser Science XXVI, OSA Technical Digest (CD) (Optica Publishing Group, 2010), paper FWO5.

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Abstract

Using FTIR spectrometry, we experimentally verify that arrays of Si₃N₄ nanorods with deep subwavelength cross sections may operate as two-dimensional optical lumped circuit elements connected in series or parallel depending on polarization of incident field.

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