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Conferences > FiO > 2009 > JWC > JWC70
  • Frontiers in Optics 2009/Laser Science XXV/Fall 2009 OSA Optics & Photonics Technical Digest
  • OSA Technical Digest (CD) (Optica Publishing Group, 2009),
  • paper JWC70
  • •https://doi.org/10.1364/FIO.2009.JWC70

Pseudo-periodic pattern for absolute bidimensional position retrieval of a zone of interest under microscope

July A. Galeano Zea and Patrick Sandoz

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Abstract

Vision system is used for absolute position measurement of a zone of view under microscope using pseudo-periodic pattern. Superimposition of recorded images in a common position reference system with subpixel accuracy is obtained by phase-computation.

© 2009 Optical Society of America

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