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  • Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing
  • OSA Technical Digest (CD) (Optica Publishing Group, 2008),
  • paper JWA62
  • https://doi.org/10.1364/FIO.2008.JWA62

Measurement Noise Tolerance of a Single-Angle Plane-Wave Photonic Crystal Characterization Method

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Abstract

A method to measure the single-angle plane-wave transmittance/reflectance of photonic crystal structures has been developed. The method employs an inverse matrix computation susceptible to measurement noise. The noise tolerance of the characterization method is identified.

© 2008 Optical Society of America

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