Mueller Matrix Measurement and Stress Engineering

Amber M. Beckley; Thomas G. Brown

doi:10.1364/FIO.2008.JSuA15

Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing
OSA Technical Digest (CD) (Optica Publishing Group, 2008),
paper JSuA15
•https://doi.org/10.1364/FIO.2008.JSuA15

Mueller Matrix Measurement and Stress Engineering

Amber M. Beckley and Thomas G. Brown

Frontiers in Optics 2008

Rochester, New York United States
19–23 October 2008
ISBN: 978-1-55752-861-2

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Joint FiO/LS Poster Session I (JSuA)

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A. M. Beckley and T. G. Brown, "Mueller Matrix Measurement and Stress Engineering," in Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing, OSA Technical Digest (CD) (Optica Publishing Group, 2008), paper JSuA15.

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Abstract

Symmetric stress-birefringence is a potential tool for pupil apodization. In exploration of its properties, Mueller matrix calculations, measurements were made, along with an analytic model of stress distribution and birefringence in windows under symmetric stress.

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