Nanoparticle Detection Using Dual-Phase Interferometry

Bradley Deutsch; Lukas Novotny

doi:10.1364/FIO.2008.FThQ4

Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing
OSA Technical Digest (CD) (Optica Publishing Group, 2008),
paper FThQ4
•https://doi.org/10.1364/FIO.2008.FThQ4

Nanoparticle Detection Using Dual-Phase Interferometry

Bradley Deutsch and Lukas Novotny

Frontiers in Optics 2008

Rochester, New York United States
19–23 October 2008
ISBN: 978-1-55752-861-2

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Imaging and Detection (FThQ)

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B. Deutsch and L. Novotny, "Nanoparticle Detection Using Dual-Phase Interferometry," in Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing, OSA Technical Digest (CD) (Optica Publishing Group, 2008), paper FThQ4.

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Abstract

We present a novel scheme for detection of sub-100nm particles using dual-phase interferometry, rendering amplitude and phase of the scattered field without frequency shifting or lock-in detection. We compare results to homodyne and heterodyne detection.

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