Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Measurement of effective refraction index from multichannel insertion loss spectra for a folded AWG multiplexer

Not Accessible

Your library or personal account may give you access

Abstract

Measurement of effective refractive index of grating and slab areas of AWG multiplexer from multi-channel polarization-dependent insertion loss measurements has been proposed. This technique of process control provides significant time-saving in large-scale AWG production.

© 2005 Optical Society of America

PDF Article
More Like This
Folded design of AWG multiplexer/demutiplexer

Nikolai M. Stelmakh
WC4 Frontiers in Optics (FiO) 2003

Folded AWG multiplexer chip under a twist deformation

Nikolai M. Stelmakh and Michael Kolesnikov
MT85 Frontiers in Optics (FiO) 2003

Ultra small and low power consumption 8ch variable optical attenuator multiplexer (V-AWG) using multi-chip PLC integration technology

A. Kaneko, Y. Hashizume, S. Kamei, Y. Doi, R. Kasahara, Y. Tamura, I. Ogawa, M. Ishii, T. Kominato, and S. Suzuki
OTuD3 Optical Fiber Communication Conference (OFC) 2005

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.