Abstract

We use a scaning near-field microscope (SNOM) in combination with a time resolved detection scheme to measure the evolution of the near-field and far-field of InGaN laser diode waveguide modes. We observe lateral mode competition, filamentation, and beam steering. From intensity distributions measured simultaneously at different propagation distances from the LD facet we reconstruct the time dependent phase distribution of the waveguide mode.

© 2005 Optical Society of America