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Conferences > FiO > 2005 > FThQ > FThQ5

A new model-independent method for the determination of guiding thin film optical parameters

Ildar F. Salakhutdinov, Yuriy V. Danylyuk, Kalyani Chaganti, Ivan Avrutsky, and Gregory W. Auner

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Abstract

A new method for the determination of thin films optical constants based on the combination of a waveguide measurement procedure with the spectroscopic measurements made from UV to IR with 0.14% accuracy has been presented.

© 2005 Optical Society of America

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