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Conferences > FiO > 2005 > FThQ > FThQ4

Characterization of transient interference in a single mode waveguide

G. W. Yuan, M. D. Stephens, D. S. Dandy, and K. L. Lear

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Abstract

Near-field scanning optical microscopy (NSOM) is used to directly measure transient interference between a guided and step induced leaky mode in a single mode waveguide. Simulations are in good agreement with the observed results.

© 2005 Optical Society of America

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