Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Instrumentation and applications of an ultrarapid scanning FT-IP spectrometer

Open Access Open Access

Abstract

Full-text article is not available.

© 2001 Optical Society of America


More Like This
Application of an Echelle Spectrometer for 2D Mapping of Aluminum Alloy Surfaces using MicroLIBS

M. T. Taschuk, M. Tripathi, I. V. Cravetchi, R. Al-Wazzan, Y. Y. Tsui, and R. Fedosejevs
PDP_3 Laser Applications to Chemical, Security and Environmental Analysis (LACSEA) 2006

Widely-Tunable Rapid-Scanning Mid-IR Laser Spectrometer for Industrial Gas Process Stream Analysis

Douglas J. Bamford, David J. Cook, Scott J. Sharpe, and Aaron D. Van Pelt
PDP_11 Laser Applications to Chemical, Security and Environmental Analysis (LACSEA) 2006

FTS measurements of the infrafred spectra of atmospheric gases and a validation of the spectroscopic data bases

P. Varanasi, Q. Zou, and C. Sun
FWB2 Fourier Transform Spectroscopy (FTS) 2001

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.