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Conferences > FTS > 1999 > FWB > FWB3

General analytic solutions for the instrument line shape of non-uniformly illuminated, off-axis detectors

Jérôme Genest and Pierre Tremblay

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Abstract

We present a simple method to calculate analytic solutions for the instrument line shape (ILS) of Fourier transform spectrometers.

© 1999 Optical Society of America

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