Characterization of planar optical components and system analysis

Augustine M. Urbas; Ekaterina Poutrina; Ekaterina Poutrina; Dean P. Brown; Dean P. Brown; Piyush J. Shah; Piyush J. Shah; Matthew R. Miller; Matthew R. Miller; Michael Marciniak

doi:10.1364/FLATOPTICS.2021.JTh4B.1

OSA Optical Design and Fabrication 2021 (Flat Optics, Freeform, IODC, OFT)
OSA Technical Digest (Optica Publishing Group, 2021),
paper JTh4B.1
•https://doi.org/10.1364/FLATOPTICS.2021.JTh4B.1

Characterization of planar optical components and system analysis

Augustine M. Urbas, Ekaterina Poutrina, Dean P. Brown, Piyush J. Shah, Matthew R. Miller, and Michael Marciniak

Flat Optics: Components to Systems 2021

Washington, DC United States
27 June–1 July 2021
ISBN: 978-1-943580-88-0

From the session
Advanced Nanofabrication and Testing for Flat Optics I (Joint Flat Optics and OF&T) (JTh4B)

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A. M. Urbas, E. Poutrina, D. P. Brown, P. J. Shah, M. R. Miller, and M. Marciniak, "Characterization of planar optical components and system analysis," in OSA Optical Design and Fabrication 2021 (Flat Optics, Freeform, IODC, OFT), F. Capasso, W. Chen, P. Dainese, J. Fan, J. DeGroote Nelson, F. Duerr, J. Rogers, J. Rolland, P. Clark, R. Pfisterer, H. Rehn, S. Thibault, M. Jenkins, D. Wook Kim, and N. Trela-McDonald, eds., OSA Technical Digest (Optica Publishing Group, 2021), paper JTh4B.1.

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Abstract

Measurement and analysis of planar elements is used to predict optical system performance and impact of planar optical component type. This is extended to optical, imaging performance, and thermal characteristics with modeling, analysis, and measurement.

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