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Fundamental Research Activities of EUV Lithography at NewSUBARU Synchrotron Light Facility

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Abstract

The recent EUVL activities of resists, masks, and optics at NewSUBARU Synchrotron Light Facility are introduced. In addition, the capabilities of the shortening the wavelength to 6.75 nm with high-power EUV source are also discussed.

© 2020 The Author(s)

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