Abstract

We evaluate a method to obtain the pathlength distribution of detected photons from reflectance as a function of absorption coefficient through inverse Laplace transformation using curve fitting as a noise reduction technique. We numerically validate our method using Monte Carlo simulations and exact solutions of time-resolved and steady state diffuse reflectance. Knowledge of the path length distribution may be helpful in drafting models for sub-diffuse reflectance measurements such as Single Fiber Reflectance Spectroscopy, whereas moments of the pathlength distribution (mean and variance) may provide diagnostic information by themselves.

© 2019 SPIE/OSA