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Sampling Function in En-face OCT

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Abstract

En-face OCT relies on scanning fast along a direction perpendicular to the optical axis. C-scan images (en-face slices at constant depth) can be obtained at different depths. The quality of the image and what part of a particular layer is visible depends on the properties of the sampling function. In this paper we examine how the scanning configuration, the interface optics, the coherence length of the source used, and the object itself influence the shape of the sampling function.

© 2003 SPIE

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