The Spatial Light Interference Microscopy technique uses four annular phase shifting patterns sequentially displayed on a spatial light modulator. The steps involved in accurately determining the optimal values of these four phase patterns are discussed.

© 2019 The Author(s)

PDF Article


You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access OSA Member Subscription