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Conferences > DH > 2016 > DTh3F > DTh3F.6

Simultaneous Measurement of Thickness and Refractive Index using Spectrum Multiplexing Digital Holographic Microscopy

Jiwei Zhang, Chaojie Ma, Ying Li, Jianglei Di, Teli Xi, and Jianlin Zhao

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Abstract

In transmission and total internal reflection integrated digital holographic microscopy, a spectrum multiplexed hologram is created. After proper spectrum extraction and image reconstruction, thickness profile and refractive index of a droplet is measured simultaneously.

© 2016 Optical Society of America

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