Abstract
A combination of phase shifting interferometry with the multi-wavelength optical phase unwrapping is used to image quantitative phase profiles of microscopic objects. The results show a surface profile with a height range of several microns.
© 2007 Optical Society of America
PDF ArticleMore Like This
N. Warnasooriya and M.K. Kim
CTuV3 Conference on Lasers and Electro-Optics (CLEO:S&I) 2007
N. Warnasooriya and M. K. Kim
TuI55 Biomedical Topical Meeting (BIOMED) 2006
N. Warnasooriya and M. K. Kim
DWB2 Digital Holography and Three-Dimensional Imaging (DH) 2008