Reflectivity Analysis of Isolated Particle on a Substrate on Incoherent Light by RCWA

Tetsuya Hoshino; Saswatee Banerjee; Sadao Aoki; Masahide Itoh

doi:10.1364/COSI.2021.CTh4E.5

OSA Imaging and Applied Optics Congress 2021 (3D, COSI, DH, ISA, pcAOP)
OSA Technical Digest (Optica Publishing Group, 2021),
paper CTh4E.5
•https://doi.org/10.1364/COSI.2021.CTh4E.5

Reflectivity Analysis of Isolated Particle on a Substrate on Incoherent Light by RCWA

Tetsuya Hoshino, Saswatee Banerjee, Sadao Aoki, and Masahide Itoh

Computational Optical Sensing and Imaging 2021

Washington, DC United States
19–23 July 2021
ISBN: 978-1-943580-89-7

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Architectures for Optical Imaging I (CTh4E)

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T. Hoshino, S. Banerjee, S. Aoki, and M. Itoh, "Reflectivity Analysis of Isolated Particle on a Substrate on Incoherent Light by RCWA," in OSA Imaging and Applied Optics Congress 2021 (3D, COSI, DH, ISA, pcAOP), H. Hua, B. Javidi, M. Martinez-Corral, O. Matoba, A. Stern, S. Thibault, T. Alieva, J. Ke, F. Willomitzer, F. Okten, P. Silveira, P. Banerjee, E. Stoykova, D. Chu, J. Park, F. Imai, C. Joo, M. Digman, D. Gardner, S. Gladysz, D. LeMaster, S. Basu, and O. Korotkova, eds., OSA Technical Digest (Optica Publishing Group, 2021), paper CTh4E.5.

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Abstract

We analyze the reflectivity of a film and rectangle with incoherent behavior by rigorous coupled-wave analysis. The sample was Rhodamine B on a transparent substrate, and its absorption spectrum was measured and simulated.

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