Deep Learned Phase Mask for Single Image Depth Estimation and 3D scanning

Harel Haim; Shay Elmalem; Raja Giryes; Alex M. Bronstein; Alex M. Bronstein; Emanuel Marom

doi:10.1364/COSI.2018.CW3B.3

Imaging and Applied Optics 2018 (3D, AO, AIO, COSI, DH, IS, LACSEA, LS&C, MATH, pcAOP)
OSA Technical Digest (Optica Publishing Group, 2018),
paper CW3B.3
•https://doi.org/10.1364/COSI.2018.CW3B.3

Deep Learned Phase Mask for Single Image Depth Estimation and 3D scanning

Harel Haim, Shay Elmalem, Raja Giryes, Alex M. Bronstein, and Emanuel Marom

Computational Optical Sensing and Imaging 2018

Orlando, Florida United States
25–28 June 2018
ISBN: 978-1-943580-44-6

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Machine Learning in Computational Sensing and Imaging I (CW3B)

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H. Haim, S. Elmalem, R. Giryes, A. M. Bronstein, and E. Marom, "Deep Learned Phase Mask for Single Image Depth Estimation and 3D scanning," in Imaging and Applied Optics 2018 (3D, AO, AIO, COSI, DH, IS, LACSEA, LS&C, MATH, pcAOP), OSA Technical Digest (Optica Publishing Group, 2018), paper CW3B.3.

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Abstract

Single image depth estimation is achieved using computational imaging and Deep Learning (DL). Imaging with phase-mask is also modeled as a DL-layer, and the mask and DL parameters are jointly designed using labeled data.

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