Correlation between RF Signal Reflection on Electrodes and Modulation Variation of Silicon Mach-Zehnder Modulators

Zhaobang Zeng; Zhaobang Zeng; Zhaobang Zeng; Peiyan Zhao; Peiyan Zhao; Peiyan Zhao; Nan Yang; Nan Yang; Nan Yang; Qianyi Gao; Qianyi Gao; Qianyi Gao; Bo Tang; Zhihua Li; Jiang Yan; Wei Jiang; Wei Jiang; Wei Jiang

doi:10.1364/CLEO_SI.2020.SF3O.6

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 2020),
paper SF3O.6
•https://doi.org/10.1364/CLEO_SI.2020.SF3O.6

Correlation between RF Signal Reflection on Electrodes and Modulation Variation of Silicon Mach-Zehnder Modulators

Zhaobang Zeng, Peiyan Zhao, Nan Yang, Qianyi Gao, Bo Tang, Zhihua Li, Jiang Yan, and Wei Jiang

CLEO: Science and Innovations 2020

Washington, DC United States
10–15 May 2020
ISBN: 978-1-943580-76-7

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Optical Comb and Spectroscopic Applications II (SF3O)

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Z. Zeng, P. Zhao, N. Yang, Q. Gao, B. Tang, Z. Li, J. Yan, and W. Jiang, "Correlation between RF Signal Reflection on Electrodes and Modulation Variation of Silicon Mach-Zehnder Modulators," in Conference on Lasers and Electro-Optics, OSA Technical Digest (Optica Publishing Group, 2020), paper SF3O.6.

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Abstract

We introduce (partial) correlation coefficients to explore the relation between the driving signal reflection on traveling wave electrodes and the performance variation of silicon Mach- Zehnder modulators. Relevant fabrication variation scenarios and potential remedies are discussed.

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