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Versatile Dispersion Measurement via a Reflective Nonlinear Interferometer

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Abstract

We present a novel dispersion measurement technique using a reflective commonpath nonlinear interferometer. Our method is fast, alignment-free, and does not require phasestabilization. It can extract the dispersion for samples with dispersion-length products as small as D × L ~0:007 ps/nm.

© 2020 The Author(s)

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