Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

In-situ loss measurements of silicon nano-waveguides using spectrum analysis and silver nano-wire as an obstacle in a reflection-based scattering NSOM

Not Accessible

Your library or personal account may give you access

Abstract

An in-situ waveguide loss measurement technique using a reflection-based scattering NSOM is developed. Putting a vibrating probe in different places along the waveguide, we accurately acquire local loss values of different segments of silicon nano-waveguides.

© 2020 The Author(s)

PDF Article
More Like This
All-fiber reflection-based scattering NSOM with low phase drift for guided-wave imaging on a chip

Yi-Zhi Sun, Bin-Bin Wang, Rafael Salas-Montiel, Sylvain Blaize, Renaud Bachelot, and Wei Ding
SM2H.7 CLEO: Science and Innovations (CLEO:S&I) 2019

Broadband Heterodyne NSOM Characterization of Propagation Loss in Waveguide Bends

Maurice Ayache, Maxim Abashin, Dawn T.H. Tan, and Yeshaiahu Fainman
IMG5 International Quantum Electronics Conference (IQEC) 2009

Low-loss D-shape Silicon Nitride Waveguides Using a Dielectric Lift-off Fabrication Process

Qiancheng Zhao, Jiawei Wang, Nitesh Chauhan, Debapam Bose, Naijun Jin, Renan Moreira, Ryan Behunin, Peter Rakich, and Daniel Blumenthal
STh1J.3 CLEO: Science and Innovations (CLEO:S&I) 2020

Poster Presentation

Media 1: PDF (1140 KB)     
Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved