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Rapid and Precise Displacement Measurement Using Time-of-Flight Detection of Femtosecond Optical Pulses

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Abstract

We demonstrate high-speed and high-resolution displacement measurement method by utilizing electro-optic sampling between electrical pulses from photodetection and femtosecond optical pulses. A 5.8-nm (1.9-nm) resolution is achieved in only 50 µs (14 ms) update time.

© 2019 The Author(s)

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