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Trace Gas Sensing through Purcell-Enhanced Raman Scattering in Pressurized Microcavities

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Abstract

Minimally long microcavities were constructed for Purcell-enhanced Raman scattering in gases at up to 12 bar pressure. A linear emission rate confirms pressure broadening remains exceeded by the cavity linewidth, making pressurization beneficial.

© 2019 The Author(s)

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