Abstract

We describe a procedure to fabricate a near-field optical fiber probe using focused ion beam milling. The method allows to control the fiber taper angle for better throughput, and the taper length for mechanical robustness.

© 2019 The Author(s)

PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription