Abstract

An all-fiber phase-resolved reflection-based near-field scanning optical microscope with a phase-drift-rate of 0.06°/s is developed. By raster scanning atomic force microscope probe, we measure the complex near-fields and analyse the standing-wave-spectrograms in silicon nano-waveguides.

© 2019 The Author(s)

PDF Article
More Like This
In-situ loss measurements of silicon nano-waveguides using spectrum analysis and silver nano-wire as an obstacle in a reflection-based scattering NSOM

Yi-Zhi Sun, Xiao-Hong Yan, Hong Wei, Sylvain Blaize, Renaud Bachelot, and Wei Ding
JW2B.30 CLEO: Applications and Technology (CLEO_AT) 2020

Near Field Phase Mapping exploiting Intrinsic Oscillations of NSOM probe

Liron Stern, I. Goykhman, B. Desiatov, and Uriel Levy
CMV4 CLEO: Science and Innovations (CLEO_SI) 2011

Influence of tip fields on NSOM Imaging

Garnett W. Bryant and Ansheng Liu
QWD22 Quantum Electronics and Laser Science Conference (QELS) 1999

View More...

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription