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Conferences > CLEO_SI > 2019 > SF1E > SF1E.4

Hyperspectral Microscopy with Broadband Infrared Frequency Combs

Henry Timmers, Abijith Kowligy, Alexander J. Lind, Nima Nader, Jonah Shaw, Dobryna Zalvidea, Jens Biegert, and Scott A. Diddams

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Abstract

We present a new modality for infrared, hyperspectral microscopy using dual-comb, electro-optic sampling of octave-spanning infrared frequency combs. We obtain hyperspectral images of SU8 test patterns on Si wafers with a spatial resolution of 12 µm.

© 2019 The Author(s)

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