Abstract
We demonstrate that ultrafast terahertz pulses focused onto the tip of scanning tunneling microscope (THz-STM) can be used to pattern structures on a silicon surface via field-assisted removal of surface atoms.
© 2018 The Author(s)
PDF ArticleMore Like This
Vedran Jelic, Peter H. Nguyen, Yang Luo, Daniel Mildenberger, Jesus A. M. Calzada, Tianwu Wang, and Frank A. Hegmann
JM2A.2 CLEO: Applications and Technology (CLEO:A&T) 2018
Vedran Jelic, Krzysztof Iwaszczuk, Peter H. Nguyen, Christopher Rathje, Graham J. Hornig, Haille M. Sharum, James R. Hoffman, Mark R. Freeman, and Frank A. Hegmann
FF3F.2 Frontiers in Optics (FiO) 2016
Tyler L. Cocker, Vedran Jelic, James R. Hoffman, Manisha Gupta, Reginald Miller, Sean J. Molesky, Jacob A. J. Burgess, Glenda De Los Reyes, Lyubov V. Titova, Ying Y. Tsui, Mark R. Freeman, and Frank A. Hegmann
08.Tue.B.6 International Conference on Ultrafast Phenomena (UP) 2014