We present a computer algorithm for layer number estimation of few-layered two-dimensional materials. Based on the optical contrast method, this algorithm analyzes an optical microscope image in a few seconds with high accuracy over 90%.
© 2018 The Author(s)
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
Login to access OSA Member Subscription