We demonstrate that 800 nm femtosecond pulses focused onto the tip of an ultrafast terahertz scanning tunneling microscope (THz-STM) can be used to sample the terahertz electric near-field at the tip apex.

© 2018 The Author(s)

PDF Article


You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
Login to access OSA Member Subscription