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Conferences > CLEO_SI > 2015 > STh3M > STh3M.2

Far-field Scattering Measurement of a Single Gold Nanorod Using Total-Internal-Reflection Illumination

Donghyeong Kim, Kwang-Yong Jeong, Ho-Seok Ee, Hong-Gyu Park, and Min-Kyo Seo

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Abstract

We demonstrate a novel method for measuring far-field scattering of a single nanostructure with a high signal-to-background ratio using total-internal-reflection illumination. Direct far-field scanning overcomes the numerical aperture limit of the typical back-focal plane imaging.

© 2015 Optical Society of America

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