Abstract
Time-resolved terahertz spectroscopy is employed to study silicon nanocrystals prepared by thermal decomposition of silicon-rich SiOx layers. We observe that higher silicon content favors formation of larger silicon clusters with short-range percolation.
© 2015 Optical Society of America
PDF ArticleMore Like This
Z. Mics, H. Němec, P. Kužel, P. Malý, and P. Němec
JThB29 CLEO: Applications and Technology (CLEO:A&T) 2011
P. Kužel, H. Němec, J. Rochford, O. Taratula, E. Galoppini, A. Yartsev, and V. Sundström
CTuBB6 Conference on Lasers and Electro-Optics (CLEO:S&I) 2010
O. Ostroverkhova, D. G. Cooke, S. Shcherbyna, R. F. Egerton, F. A. Hegmann, R. R. Tykwinski, J. E. Anthony, V. Podzorov, M. E. Gershenson, O. D. Jurchescu, and T. T. M. Palstra
TuB7 Optical Terahertz Science and Technology (OTST) 2005