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Defect-Assisted Sub-Bandgap Avalanche Photodetection in Interleaved Carrier-Depletion Silicon Waveguide for Telecom Band

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Abstract

We experimentally demonstrate avalanche sub bandgap detection of light at 1550 nm wavelength via surface states using the configuration of interleaved PN junctions along a silicon waveguide. The device operates in a fully depleted mode.

© 2014 Optical Society of America

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