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Investigation of Photoluminescence from Ge1-xSnx: A CMOS-Compatible Material Grown on Si via CVD

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Abstract

Photoluminescence (PL) from Ge1-xSnx grown on Si by CVD was investigated for Sn composition of 0.9, 3.2, 6, and 7%, respectively. The direct and indirect band transitions were analyzed at different temperatures.

© 2014 Optical Society of America

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