MHz-rate high-resolution reflectometry by direct mapping of the full axial-line profile in a single-shot oscilloscope trace

Antonio Malacarne; Yongwoo Park; José Azaña

doi:10.1364/CLEO_SI.2011.CFG7

CLEO:2011 - Laser Applications to Photonic Applications
OSA Technical Digest (CD) (Optica Publishing Group, 2011),
paper CFG7
•https://doi.org/10.1364/CLEO_SI.2011.CFG7

MHz-rate high-resolution reflectometry by direct mapping of the full axial-line profile in a single-shot oscilloscope trace

Antonio Malacarne, Yongwoo Park, and José Azaña

CLEO: Science and Innovations 2011

Baltimore, Maryland United States
1–6 May 2011
ISBN: 978-1-55752-910-7

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Ultrafast Pulse Shaping (CFG)

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A. Malacarne, Y. Park, and J. Azaña, "MHz-rate high-resolution reflectometry by direct mapping of the full axial-line profile in a single-shot oscilloscope trace," in CLEO:2011 - Laser Applications to Photonic Applications, OSA Technical Digest (CD) (Optica Publishing Group, 2011), paper CFG7.

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Abstract

A concept is introduced for optical reflectometry based on real-time spectral interference pattern Fourier transformation, enabling direct axial-line mapping with hundreds of sampling points in a single-shot oscilloscope trace at MHz update rates.

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