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Penetration Depth Engineering in Plasmonic Metafilms for Enhanced Reflection and Confinement

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Abstract

We introduce a metafilm consisting of regions of metal and dielectric, which has a much smaller penetration depth than that of a corresponding metal film, leading to enhanced device performance in lightweight ultrahigh reflectivity reflectors and increased packing density of subwavelength waveguides.

© 2020 The Author(s)

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