Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > CLEO_QELS > 2019 > JTh2A > JTh2A.49

The role of surface passivation in integrated sub-bandgap on-chip silicon photodetectors

Rivka Gherabli, Meir Grajower, Joseph Shappir, Noa Mazurski, and Uriel Levy

Not Accessible

Your library or personal account may give you access

Abstract

We demonstrate the role of passivation in silicon photonics photodetectors based on defect states operating in the sub bandgap regime. Upon passivation removal, higher responsivity is obtained alongside with loss reduction, surprisingly improving over time.

© 2019 The Author(s)

PDF Article
More Like This
Near-infrared silicon sub-bandgap photo-detectors for on-chip integrated optical links

Jong-Bum You and Kyoungsik Yu
26J3_3 Conference on Lasers and Electro-Optics/Pacific Rim (CLEO/PR) 2015

Defect-Assisted Sub-Bandgap Avalanche Photodetection in Interleaved Carrier-Depletion Silicon Waveguide for Telecom Band

Boris Desiatov, Ilya Goykhman, Joseph Shappir, and Uriel Levy
STh4I.4 CLEO: Science and Innovations (CLEO:S&I) 2014

Silicon Microring Resonator Integrated MoTe2 Photodetector

Rishi Maiti, Chandraman Patil, Rohit Hemnani, and Volker J. Sorger
NoW2B.4 Novel Optical Materials and Applications (NOMA) 2019

View More...
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use